Recent News on Awards and Honors

·                    Fellow, American Vacuum Society, 2016.

·                    Cover page article in ECS J. Solid State Sci. Technol., March 2016.

·                    Gordon E. Moore Medal of Outstanding Achievement in Solid Science and Technology, ECS, 2015.

·                    Vice President, Electrochemical Society, Pennington, NJ (05/15-05/18).

·                    Texas Experimental Engineering Station Fellow (05/2015). 

·                    IEEE Spectrum Tech News (12/23/2014).

·                    Paper ranked #1 most-cited solid state article in ECS Transactions as of July 1, 2014. ECS Trans. 2006 1(5): 447-454; doi:10.1149/1.2209294

·                    Innovation Award, Texas A&M University System, College Station, TX (04/25/2014).

·                    Cover page article in J. Vac. Sci. Technol. B, January/February 2014.

·                    A top 20 Most Downloaded Paper in J. Vac. Sci. Technol. B on a new metal-doped High-k film, May 2013.

·                    A Research Highlight paper in Appl. Phys. Letts., February, 2013 on the new type of LED based on thin film metal oxides.

·                    Distinguished Achievement Award in Research (the most prestigious award that can be presented to faculty), Association of Former Students and Texas A&M University, 04/2012.

·                    Paper selected to J. Appl. Phys. Research Highlights & News, April 19, 2012
C.-C. Lin and Y. Kuo, “Failure mechanism of electromigration of copper interconnections deposited on topographic steps with a plasma-based etch process,” J. Appl. Phys., 111, 064909 (2012).

·                    Paper selected by AIP/APS in Virtual J. Nanoscale Sci. and Technol. 24(5) 2011
C.-H. Lin and Y. Kuo, “Nanocrystalline ruthenium oxide embedded zirconium-doped hafnium oxide high-k nonvolatile memories, J. Appl. Phys. 110, 024101 (2011).

·                    Paper selected by AIP/APS in Virtual J. Nano. Science & Technology 22(22) 2011.
C.-H. Yang, Y. Kuo, C.-H. Lin, and W. Kuo, “Temperature Influence on Nanocrystals Embedded High-k Nonvolatile CV Characteristics,” Electrochem. Solid-State Lett. 14, H50 (2010). ESLEF6000014000001000H50000001&viewabs=VIRT01&key=DISPLAY&docID=1&page=0&chapter=0

·                    Honorary Visiting Professor, Shanghai Jiaotong University, 12/2009.

·                    Honorary Visiting Professor, Nankai University, 07/2009.

·                    Honorary Visiting Professor, Xi’an Jiaotong University, 05/2009. 

·                    Top 20 most downloaded paper, J. J. Appl. Phys., 2008.
Y. Kuo,
“TFT and ULSIC – Competition or Collaboration,” Jpn. J. Appl. Phys., 47(3), 1845-1852 (2008).

·                    Above paper was also selected by AIP/APS in Virtual J. Nano. Science & Technology 17(21) 2008 article&OUTLOG=NO&id=JAPNDE000047000003001845000001&viewabs=VIRT01&key=DISPLAY&docID=2&page=0&chapter=0

·                    Paper selected by AIP/APS in Virtual J. Nanoscale Sci. and Technol. 17(17) 2008.
J. Lu, C.-H. Lin, and Y. Kuo, “Nanocrystalline Zinc Oxide Embedded Zirconium-doped Hafnium Oxide for Nonvolatile Memories,” J. Electrochem. Soc., 155(6) H386-H389 (2008).

·                    Paper selected by AIP/APS in Virtual J. Bio. Phys. Res. 15(10), 2008.
H. H. Lee and Y. Kuo, “Surface Modification of Gel-Free Microchannel Surface Electrophoresis Device for DNA Identification,” Jpn. J. Appl. Phys. 47, 2300 (2008). Yue+Kuo&possible1zone=article&OUTLOG=NO&id=JAPNDE000047000004002300000001&viewabs=VIRT02&key= DISPLAY&docID=1&page=0&chapter=0

·                    3rd award of ECI Semiconductor Conference poster papers, Barga, Italy, 2007.
H. Nominanda, Y. Kuo, C.-C. Chen, and C.-C. Hwang, “Radiation Exposure Effect on Amorphous Silicon Thin Film Transistors, ECS Trans., 8(1), 261-266 (2007).

·                    Electrochemical Society Electronics and Photonics Division award, 2007.

·                    IEEE Electron Device Society Distinguished Speaker, 2007-present.

·                         Top 25 Hottest paper in Microelectronics Reliability, Jan.-March 2006.
S. Chatterjee, Y. Kuo, J. Lu, J.-Y. Tewg, and P. Majhi, “Electrical Reliability Aspects of HfO2 High-k gate Dielectrics with TaN Metal Gate Electrodes under Constant Voltage Stress,” Microelectronics and Reliability, 46(1), 69-76 (2006).

·                    Paper selected by AIP/APS in Virtual J. Nanoscale Science & Technology 13(15), 2006.
H. H. Lee and Y. Kuo, “Integration of an Amorphous Silicon Thin Film Transistor with a Microchannel Electrophoresis for Protein Identification,” Electrochemical and Solid-State Letters 9, J21-J23 (2006).

·                    Above paper was also selected by AIP/APS in Virtual J. Bio. Phys. Res. 11(8), 2006. =article&OUTLOG=NO&id=ESLEF6000009000006000J21000001&viewabs=VIRT02&key=DISPLAY&docID=2&page=0&chapter=0

·                    Fellow, Texas Engineering Experiment Station, 09/2005. 

·                    Fellow, Electrochemical Society, 1999.

·                         Fellow, IEEE Electron Devices Society, 1998.


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